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Equipment log for the Veeco AFM
| 2009-7-9 | The tool will be down until the end of tomorrow for training. After that, users will need to be retrained with the new software. |
| 2009-7-9 | Tool down for scanner swapout. More information tomorrow. |
| 2009-7-7 | The system is being used for upgrades and training. Please do not attempt to log in or use the system. |
| 2009-7-21 | If you need to get retrained with the new software, please email Rathi as she is now back. Please email Rathi, Nick Ginga, or Eric Woods in that order.
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| 2009-7-20 | If you need to get retrained with the new software, please email Rathi as she is now back. For any AFM training needs, please see Rathi, Nick Ginga, or Eric Woods.
Thank you. |
| 2009-7-14 | Several users were refamiliarized with the new software today. There will be another session tomorrow afternoon at 1pm.
If you need to be retrained, please come then.
Remember: if you have not been retrained - when the tool is marked up again, under no circumstance attempt to use the tool until you have been retrained. Please email the trainers and request to be retrained.
Thank you for your cooperation in keeping the tool operational for new users. |
| 2009-7-11 | Tool down as all users need to be retrained. Dates and times will be announced shortly. |
| 2009-6-23 | The Veeco AFM will be unavailable for the first part of the week of 7 July. It is anticipated that the engineer will spend one to two days performing the installation of the Nanoscope V controller upgrade and will perform some training for staff and interested users the following day (Thursday 9 July). More information will be passed on as it becomes available. Please plan on the system being unavailable for the week of 7 July.
If you have any further questions regarding this matter, please see myself and/or the cleanroom manager. |
| 2006-11-3 | The access controller for the AFM is now working properly. |
| 2005-7-20 | An email was sent out explaining the
problems with the X-Y scan board being
bad. Look for a future update from Joel as
to when this system is once again
operational. |
| 2005-3-14 | If you are interested in using the AFM or Optical Profilometer and/or a
current user of these systems, please plan to attend the Metrology Seminar
tomorrow. See info below.
Veeco is going to be here tomorrow to do a seminar. Notice the morning
session will cover the optical profilometer and AFM. Please plan to attend
this event. PLEASE REGISTER ONLINE for the seminar. (see link at bottom of
page)
Veeco invites you to a Free Metrology Seminar and Workshop.
New Advances in Atomic Force Microscopy and Optical MEMS Measurement
Morning Presentations: 8:30am - Noon
RSVP: For details and registration please visit
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| 2005-3-10 | PEOPLE DO NEED TO REGISTER!!
Veeco invites you to a Free Metrology Seminar and Workshop.
New Advances in Atomic Force Microscopy and Optical MEMS Measurement
Morning presentations:
* The New NanoMan II AFM with Hybrid XYZ Scanner - the preeminent
system for high-resolution imaging, high definition
nanolithography and direct Nanoscale manipulation
* Stroboscopic Interferometry for MEMS: Static & dynamic device
characterization
*
3D Characterization of Packaged MEMS Devices using optical
profiling techniques
Afternoon session:
Hands-on AFM and optical measurements of participants' samples.
Lunch and refreshments will be served.
Seminar & Workshop dates:
Tues., March 15
Georgia Tech, Microelectronics Research Center
Atlanta, GA
RSVP: For details and registration please visit
www.veeco.com/metrology_workshop
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