Microelectronics Research Center

Questions, comments, complaints, bugs about this page? We would like to hear from you.

The FIB-Center at GT (FIB2) Moves to MiRC

Relocation to Pettit Building Room 160

Sep 13, 2007:

Dear Core PIs, Dear Colleagues, Dear FIB users:

After extensive discussions on the future of the FIB-Center at Georgia Tech beyond the NSF funding period and its sustained maintenance and growth, we are honored to announce that the FIB-Center will become a visible component of the Microelectronics Research Center (MiRC), and will relocate to the Pettit Building, room 160. Both FIB-SEM systems will be operated outside the Cleanroom, and full access for users who do not require Cleanroom conditions (e.g., for TEM sample preparation) remains ensured at the same conditions currently established at the FIB-Center.

We are more than pleased with this development, as the diverse background of the MiRC users base will significantly expand and enhance the FIB users community on state-of-the-art nanofabrication and -characterization with FIB-SEM technology, which ideally complements the e-beam lithography system at MiRC. We anticipate that an even broader user base will now take advantage of FIB-SEM technology, while the already existing user community at the FIB-Center will benefit from the proximity to MiRC, and its rather outstanding selection of micro- and nanofabrication technologies.

In the past, IPST has served as location for the FIB-Center during the NSF: CRIF grant period, however, not with sufficient continuity to the standards required for operating these instruments 24/7 at the highest possible quality level. As system performance, accessibility, a broad user base, and sustained maintenance of these tools is our highest priority for the on-campus, off-campus, and industrial user community, it is essential to relocate these instruments to the MiRC building, where they will be embedded within an excellent multi-user infrastructure.

We hope that you will continue contributing to the expanding range of applications for FIB-SEM technology, and to the ongoing growth of the FIB Center at MiRC.

The move is planned for end of September 2007; therefore, the FIB-SEM systems will be down for approx. 2-4 weeks. Please plan accordingly. We will keep you posted on the precise downtime for the systems as the move progresses. However, we assure all users that we will make every effort in minimizing the impact on the accessibility of these essential research tools.

Please do not hesitate to approach Dr. Mizaikoff or Dr. Kranz with any questions you might have.

Boris Mizaikoff
Christine Kranz
Thomas Orlando
Kevin Martin
Jim Meindl